Semiconducting and piezoelectric nanowires (NWs) are very attractive for mechanical transducer applications like sensors, energy harvesters and piezotronics devices. Theoretical simulations predict that controlling the dimensions of the NWs and their semiconducting properties is key to enhance their piezoelectric performance. In this work, we perform near-field characterization measurements of piezoelectric and semiconducting vertically grown ZnO NWs. Different Atomic Force Microscopy techniques are used under controlled ambient conditions (air and N2): Piezoresponse Force Microscopy, Conductive AFM and Kelvin Probe Force Microscopy. The results from these different techniques are correlated between them and to multiphysics theoretical simulations (coupling semiconductor and piezoelectricity) from the literature. The experimental results indicate the importance of the control of the semiconducting properties of these NWs (e.g. doping, surface traps) to enhance their piezoelectric performance. Furthermore, Scanning Microwave Impedance Microscopy measurements are performed for the first time in this kind of structures. This technique could provide important information for the evaluation of doping concentrations on these NWs. © 2025 Elsevier B.V., All rights reserved.